The Center for Research in Nanotechnology and Advanced Materials, CIEN-UC, at the Pontifical Catholic University of Chile, is equipped with instruments such as the FESEM Scanning Electron Microscope with Lithography, XPS X-ray Photoelectron Spectrometer, and the Confocal Micro-Raman – AFM Spectrometer in its Centralized Advanced Characterization Laboratory. For more information, please visit the services section of our website.
The Research Center for Nanotechnology and Advanced Materials, CIEN-UC, belongs to the Pontificia Universidad Católica de Chile and performs high-level scientific research oriented technology application.
X-Ray Photoelectron Spectroscopy / Specs Flexps Spectrocopy System
In this section you will find all the publications of the researchers associated with CIEN-UC.
