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Centralized Platform for Advanced Characterization CIEN-UC

Microscopio electrónico de barrido de alta resolución (FE-SEM)

FESEM – High Resolution scanning electron microscopy

The FEI Quanta FEG250 is a high-resolution field emission scanning electron microscope (FESEM). It is equipped with a backscattered electron detector, a transmitted electron detector (STEM), and an energy-dispersive X-ray spectroscopy (EDS) system

Xps – X-Ray Photoelectron Spectroscopy / Specs Flexps Spectrocopy System

The FlexPS-CIENUC, SPECS brand (Berlin, Germany) is an X-ray photoelectron spectroscopic analysis system that allows obtaining surface information (a few nanometers) on the chemical composition and oxidation states of a sample. It is equipped with an XR 50 (Al/Ag) double anode X-ray source, a FOCUS 500 monochromator and a Phoibos 150 hemispherical analyzer.

XPS
Microscopio Confocal Raman acoplado a microscopía de fuerza atómica (AFM-Raman)

Micro-Raman Confocal Spectrometer – AFM

The WITec Alpha 300 RA Raman spectrometer is a molecular vibrational state analyzer microscope that operates based on the quantum phenomenon “Raman shift.”