Xps – X-Ray Photoelectron Spectroscopy / Specs Flexps Spectrocopy System
The FlexPS-CIENUC, SPECS brand (Berlin, Germany) is an X-ray photoelectron spectroscopic analysis system that allows obtaining surface information (a few nanometers) on the chemical composition and oxidation states of a sample. It is equipped with an XR 50 (Al/Ag) double anode X-ray source, a FOCUS 500 monochromator and a Phoibos 150 hemispherical analyzer.
XPS is an Ultra High Vacuum (UHV) technique, so the usual restrictions for these conditions are applied.
This equipment was acquired thanks to the funds received throught the acquisition of the project FONDEQUIP EQM 170087.
It is possible to study various materials, such as polymers, oxides, metal alloys, semiconductors, glass, ceramics and bio-materials, among others.
The samples to be analyzed can be presented as powder, deposit, sheet or as a piece of material.
Technical Specifications
- XR50M X-ray sources with double anode.
- Ag anode with Kα radiation at 2984.30 eV and
- Al anode with Lα radiation at 1486.71 eV.
- FOCUS 500 X-ray monochromator.
- Phoibos 150 analyzer with 1D-DLD Detector.
- FG 15/40 Electron flood gun for charge compensation.
- Sublimation and turbomolecular, ionic pump vacuum system
- Prechamber for samples mounting
- Pre-chamber pressure: < 1 x 10-8 mbar
- Analysis chamber pressure: ~2 x 10-10 mbar
- Sample holder with 4 degrees of freedom (X,Y,Z,Tilt).
- X-ray incidence angle: 54.7°. Detection angle 90°.
- Tilt angle displays: 0° – 75°.
- Stainless steel vacuum chamber.
Rates
Check rates here
You can enter a work order in the following form: ODT Request ODT Request
For additional information, quotes or other queries, contact Álvaro Adrian at fesemcien@uc.cl or by phone (56-9) 5504 1441, opening hours from Monday to Friday from 9:00 a.m. to 13:00 p.m. and from 14:00 p.m. to 18:00.
Location
