Equipment

High-Resolution Scanning Electron Microscope (FE-SEM) with Electron Beam Lithography and EDS

The FEI-Quanta 250 FEG microscope is equipped with a Schottky field emission cathode, enabling high-resolution imaging in high and low vacuum modes, as well as in environmental mode (ESEM). This allows for the analysis of non-conductive samples and/or hydrated specimens. Additionally, this equipment supports transmission mode observation (STEM) and the acquisition of backscattered electron images, providing atomic number contrast through its concentric backscatter detector. It is also capable of performing elemental composition microanalysis via energy-dispersive X-ray spectroscopy (EDS). Furthermore, the microscope is equipped with a module that allows for electron beam lithography (EBL).

X-Ray Photoelectron Spectrometer (XPS)

The FleXPS by SPECS is a spectrometer equipped with a PHOIBOS 150 hemispherical energy analyzer with a 1D-DLD detector and a monochromatic X-ray source FOCUS 500 with dual anode (Ag/Al), enabling high-resolution energy spectra acquisition. Additionally, the equipment features a flood gun that facilitates measurements on both conductive and insulating samples, providing detailed information about the elemental composition and oxidation states of surfaces.

Raman – AFM Confocal Microscope

The WITec Alpha 300 microscope integrates the advanced features of Raman spectroscopy with atomic force microscopy (AFM). The spectrometer allows for the analysis of vibrational states of samples and, thanks to its confocal optics, enables micrometric mapping and high-resolution 2D Raman imaging. The system operates with selectable wavelengths of 532 nm and 785 nm, with adjustable intensity. The coupled atomic force microscope allows for topographic characterization with nanometric resolution. Combining both techniques facilitates the acquisition of correlative images with chemical and topographic information, without requiring sample preparation and being minimally invasive.

Equipment in laboratories associated with CIEN-UC

CIEN-UC, thanks to its relationship with the Faculties of Engineering, Physics, and Chemistry, has a variety of research equipment that enables it to conduct research in various fields related to Nanotechnology and Materials Science

Some of the equipments

Semiconductors Probe Station
Semiconductors Parameters Analyzer
Vector Network Analyzer
Powder X-Ray Powder Diffractometer
High-Resolution Transmission Electron Microscope (HRTEM)
Transmitted Light Petrographic Microscope (polarizing)
Petrographic Microscope (Polarized Light Microscope)
Optical Microscopes
Atomic Force Microscope (AFM)
64 core capacity computer cluster
Mini-Ellipsometer MicroAeth AE51
Dustrack 8530II Continuous Particle Concentration Monitor
MetOne Particulate Profiler 212-1
Electrostatic Sampler EspNano100
Partisol2000i Sampler (Outdoor)
TAS Samplers (Indoor)
Low-Temperature Electrical Transport Measurement System
Solar Simulator
Ferroelectric Circuit RT66B-Radiant Tech
Sputtering Deposition System
Plasma Etching System for Microfabrication
Advanced Physical Vapor Deposition System
Electron Beam Evaporator
Thermal Evaporator
Chemical Vapor Deposition Reactor (CVD)
Gas Discharge Optical Emission Spectrometer (GDOES)
UV-VIS-NIR Spectrometer