The high-resolution transmission electron microscope (HRTEM), model Talos F200X G2 by Thermo Fisher Scientific, enables detailed observation of the internal structure of materials at the nanometric scale.

Operating Principle

The instrument uses an electron beam that passes through an ultrathin sample (less than 100 nm). As the electrons interact with the atoms of the material, they produce a high-resolution image on the detector. This technique is essential for studying interfaces, grain boundaries, and crystalline defects.

Moreover, HRTEM is widely used in materials science, nanotechnology, structural biology, and surface chemistry.

Technical Specifications

The Talos F200X G2 is equipped with a high-stability, high-brightness field emission gun (FEG). It operates between 20 kV and 200 kV, achieving a resolution of up to 0.12 nm in TEM mode and a maximum magnification of 1,000,000×. Thanks to these specifications, it allows the observation of internal structures with atomic-level detail.

Applications

The Talos F200X G2 transmission electron microscope is used across a wide range of scientific research fields. In materials science, it allows the observation of crystalline defects, grain boundaries, and interfaces, providing key information for understanding the mechanical and electrical behavior of materials. It is also fundamental for studying thin films, metallic alloys, and nanocomposites, where it reveals the morphology and orientation of internal phases.

In nanotechnology, it is employed to analyze nanoparticles, nanotubes, and nanowires, producing high-resolution images that show their size and degree of crystallinity. In structural biology, it enables the visualization of proteins, viruses, and tissues with nanometric-scale detail. Finally, in surface chemistry, HRTEM supports the investigation of catalysts and functional materials, contributing to the development of new processes and technological applications.

Services Associated with the High-Resolution Transmission Electron Microscope

Among the complementary services offered are:

• Mounting on TEM grids.
• Sample preparation in suspension.
• Embedding in resin, trimming, and ultrathin sectioning.

The instrument is not equipped with an energy-dispersive X-ray spectroscopy (EDS) system or electron diffraction capabilities.

Contact

For more information, quotations, scheduling, and other inquiries, contact Álvaro Adrián at fesemcien@uc.cl or +56 9 5504 1441. Office hours: Monday to Friday, 09:00–13:00 and 14:00–17:00 (Chile Time).

Documents and Links

Manufacturer Information
Download Presentation Document
Download Service Protocol

Other Services