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Field emission scanning electron microscopy (FESEM)

The Field Emission Scanning Electron Microscope (FESEM) available at the Center for Research in Nanotechnology and Advanced Materials (CIEN-UC) enables the observation and analysis of materials at the nanometer scale, offering higher resolution than a conventional scanning electron microscope (SEM).
Its Field Emission Gun (FEG) produces a high-intensity, low-dispersion electron beam, allowing the acquisition of sharp, high-contrast images even at low accelerating voltages.
The instrument operates under high, low, and variable vacuum modes, making it suitable for studying a wide range of materials—metallic, ceramic, polymeric, biological, or insulating—under controlled environmental conditions.

The scanning electron microscope was acquired through FONDEQUIP funding EQM150101.
Download file “Presentación FESEM FEI Quanta FEG250“

Main technical specifications

  • Model: FEI Quanta FEG 250
  • Electron source: Field Emission Gun (FEG)
  • Accelerating voltage range: 200 V – 30 kV
  • Resolution: up to 1.2 nm at 30 kV
  • Operating modes: High vacuum, low vacuum, and environmental (ESEM).
  • Available detectors:
    • Secondary electrons (SE): high-resolution topographic imaging.
    • Backscattered electrons (BSE): compositional contrast and phase detection based on atomic number differences.
    • Gaseous secondary electron detector (GSED).
  • Analytical system: Energy Dispersive X-ray Spectroscopy (EDS) for spot, line, and chemical mapping (EDS mapping) with micrometric spatial resolution.

Available services

The FESEM service at CIEN-UC is available to researchers, graduate students, external institutions, and companies, offering specialized support in:

  • High-resolution imaging for morphological and topographical analysis.
  • Elemental analysis by EDS, providing qualitative and semi-quantitative identification of the elements present in the sample.
  • EDS mapping to determine the spatial distribution of chemical elements across the surface.
  • Compositional contrast analysis using backscattered electrons (BSE).
  • Measurement of particle size, shape, and surface texture in solid materials, coatings, fibers, films, or powders.
  • Sample preparation assistance, including metallic coating (Au) and critical point drying when required.

Download Available Services

Applications

  • Materials science and engineering.
  • Nanotechnology and microstructure analysis.
  • Coatings, thin films, and functionalized surfaces.
  • Heterogeneous catalysis and composite materials.
  • Geology, mining, and soil characterization.
  • Polymers, ceramics, biological samples, and porous materials.

Rates

Check general rates here. Ask about discounts according to institutional affiliation and extended service packages.

Schedule

Book your session at the following link: Agenda FESEM

You can participate in the session remotely via video call.

Please make sure to set your time zone correctly.

Before the session, please complete the work order form at the following link:

Application Form

For further information, quotations, or other inquiries, please contact Álvaro Adrián at fesemcien@uc.cl or (56-9) 5504 1441.
Office hours: Monday to Friday, 09:00–13:00 and 14:00–17:30.

Location

Laboratorio CIEN-UC FESEM
How to get here